Surface Science Spectra (SSS) is devoted to archiving spectra from various surface analysis techniques including x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), low energy ion scattering (LEIS) spectroscopy, and optical measurements including spectroscopic ellipsometry (SE) and ultraviolet-visible spectroscopy (UV-vis).
The journal publishes three types of spectra articles: Reference, Comparison, and Technical. The associated data is searchable and downloadable directly from the online article. Visit our website to find the scope of the journal and more information.
As data availability becomes more important and challenges to reproducibility and replication of data continue, consider submitting your data to SSS simultaneously with your research submission. Upon acceptance in SSS, your data would be stored and available as a reference to researchers worldwide, and you would have the accomplishment of another peer-reviewed publication. Submission requirements and templates can be found here.
Check out articles from different techniques – Free for a limited time!
SIMS
Fatty acid and sphingosine reference spectra
Daniel J. Graham, Michael J. Taylor, Katherine Y. Zhang and Lara J. Gamble
Submicrometer ultrananocrystalline diamond films processed in oxygen and hydrogen plasma and analyzed by UV-vis spectroscopy: Thickness and optical constant results
Gongxiaohui Chen, Linda Spentzouris, Kiran Kumar Kovi and Sergey V. Baryshev
