Beneath the AVS Surface Member News & Updates
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Student & Divisional Call for Award Nominations
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Student & Divisional Award Nominations Deadline: May 10, 2023, 11:59 PM EDT
Please remember to apply for AVS Student National & Divisional Awards by May 10, 2023 11:59 PM EDT. If you are submitting an abstract to a session co-sponsored by a division or focus topic, you are still eligible to apply for that division's or focus topic's student award.
National Student Awards
A total of eight national awards are given including: five (5) named awards and three (3) Graduate Research Awards for outstanding research by graduate student listed below. Please give this ADVISOR GUIDELINE (PDF) to your advisor. Your advisor will need to complete the required information online by the submission deadline. Please ensure that you give your advisor some extra time to complete the information on or before the deadline. No exceptions will be granted.
Divisional Student Awards
Numerous Divisional Awards in technical areas of interest to AVS are available. Students may apply for a National Student Award and one Division Group Award in a given year. If you are applying for a national award and divisional award, please make 2 separate applications - one for the national award and one for the divisional. See the requirements under the name of the Division Award.
Questions? Please contact Angela Klink, AVS Member Services Administrator, angela@avs.org
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Multiple Pathways Explored for Thermal Etching of Metal Oxide
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Authors: Jonas C. Gertsch, Jonathan L. Partridge, Austin M. Cano, Joel W. Clancey, Victor M. Bright, and Steven M. George
Journal of Vacuum Science & Technology A, Vol. 41, No. 1, Jan/Feb 2023
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Sequential exposure to versatile reactants reveals multiple reaction mechanisms in thermal atomic layer etching of vanadium oxide.
Thermal atomic layer etching (ALE) is a promising new method for semiconductor device etching. It involves a series of two surface reactions; the first modifies the surface layer of a material and the second volatilizes that modified layer. The result is an isotropic etch process in contrast to traditional, anisotropic plasma ALE.
In the AVS Journal of Vacuum Science & Technology A, researchers from the University of Colorado Boulder explored the thermal ALE of vanadium oxide (VO2) using sequential exposures of boron trichloride (BCl3) and sulfur tetrafluoride (SF4).
VO2 is a room-temperature semiconductor with thermoresistive properties, so its resistivity and optical transmittance change as a function of temperature. This leads to potential applications in bolometers and smart windows, which conserve energy by becoming more reflective with increasing sunlight. The most effective implementations of the semiconductor require thin films that could be obtained using thermal ALE.
“Higher sensitivity is obtained for thinner VO2 films because the heat is absorbed in a smaller volume,” said author Steven George. “We needed VO2 ALE to fabricate the thin films for bolometers.”
The team explored the interactions between BCl3, SF4, and VO2 during the etch process using Fourier transform infrared spectroscopy and quadrupole mass spectrometry. They determined the mechanisms and pathways for etching material as well as the rates and limiting factors for each reaction. They identified multiple pathways due to the range of possible reactions.
“BCl3 is a versatile reactant that can undergo ligand-exchange with metal fluorides,” said George. “It also has the ability to convert metal oxides to B2O3 because B2O3 is a very stable metal oxide. This is important because B2O3 can be easily spontaneously etched using fluorination reactants like SF4.”
They found that VO2 thermal ALE occurred with BCl3 participating in both ligand-exchange and conversion processes. They also observed oxidation reactions with SF4. Using sequential exposures of both reactants, the team was able to employ and study each of these pathways during etching.
The authors plan to continue their work exploring additional materials and processes.
“My research group is working to develop thermal ALE for a wide spectrum of materials,” said George. “To this end, we are trying to develop a range of mechanisms. This will be valuable because isotropic etching is required for the fabrication of devices such as gate-all-around transistors and 3D NAND.”
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Implementation of High-Performance and High-Yield Nanoscale Hafnium Zirconium Oxide Based Ferroelectric Tunnel Junction Devices on 300 mm Wafer Platform
Authors: Maximilian Liehr, Jubin Hazra, Karsten Beckmann, Vineetha Mukundan, Ioannis Alexandrou, Timothy Yeow, Joseph Race, Kandabara Tapily, Steven Consiglio, Santosh K. Kurinec, Alain C. Diebold, and Nathaniel Cady
Publication: Journal of Vacuum Science & Technology B, Vol. 41, 012805 (2023)
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In this work, hafnium zirconium oxide (HZO)-based 100 × 100 nm2 ferroelectric tunnel junction (FTJ) devices were implemented on a 300 mm wafer platform, using a baseline 65 nm CMOS process technology. FTJs consisting of TiN/HZO/TiN were integrated in between metal 1 (M1) and via 1 (V1) layers. Cross-sectional transmission electron microscopy and energy dispersive x-ray spectroscopy analysis confirmed the targeted thickness and composition of the FTJ film stack, while grazing incidence, in-plane x-ray diffraction analysis demonstrated the presence of orthorhombic phase Pca21 responsible for ferroelectric polarization observed in HZO films. Current measurement, as a function of voltage for both up- and down-polarization states, yielded a tunneling electroresistance (TER) ratio of 2.28. The device TER ratio and endurance behavior were further optimized by insertion of thin Al2O3 tunnel barrier layer between the bottom electrode (TiN) and ferroelectric switching layer (HZO) by tuning the band offset between HZO and TiN, facilitating on-state tunneling conduction and creating an additional barrier layer in off-state current conduction path. Investigation of current transport mechanism showed that the current in these FTJ devices is dominated by direct tunneling at low electric field (E < 0.4 MV/cm) and by Fowler–Nordheim (F–N) tunneling at high electric field (E > 0.4 MV/cm). The modified FTJ device stack (TiN/Al2O3/HZO/TiN) demonstrated an enhanced TER ratio of ∼5 (2.2× improvement) and endurance up to 106 switching cycles. Write voltage and pulse width dependent trade-off characteristics between TER ratio and maximum endurance cycles (Nc) were established that enabled optimal balance of FTJ switching metrics. The FTJ memory cells also showed multi-level-cell characteristics, i.e., 2 bits/cell storage capability. Based on full 300 mm wafer statistics, a switching yield of >80% was achieved for fabricated FTJ devices demonstrating robustness of fabrication and programming approach used for FTJ performance optimization. The realization of CMOS-compatible nanoscale FTJ devices on 300 mm wafer platform demonstrates the promising potential of high-volume large-scale industrial implementation of FTJ devices for various nonvolatile memory applications.
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Capabilities and Limitations of Polymer Brush Simulations
Authors: Mohamed A. Abdelbar, James P. Ewen, Daniele Dini, Stefano Angioletti-Uberti
Biointerphases, Vol. 18, No. 1, January/February 2023
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Computer simulations, when tested against experimental data, provide insight into polymer brush properties that are otherwise difficult to measure.
When polymer chains are densely grafted to solid surfaces, they form polymer brushes (PBs). The molecular configurations create an effective, low-friction lubrication method that is potentially useful for understanding and restoring human joints.
Because properties of PBs are difficult to directly study, computer simulations are used to model PB behavior. Researchers from Imperial College London investigated PB simulations and discussed their findings in the AVS journal Biointerphases. Abdelbar et al. provided a perspective on the advancements and gaps in simulating PB lubrication and the challenges of comparing models to experimental data.
PBs occur when polymer chains, end-grafted onto a substrate, are packed densely enough that steric excluded volume repulsion holds them perpendicular to the substrate. Polymer brush bilayers are the most common configuration; they provide lubrication to mammal synovial joints, including the human knee.
PBs are also fabricated to reduce friction in water-lubricated systems. As technology and understanding of PBs advance, manufactured PBs, like those with oleophilic properties, achieve lower friction and higher load-bearing capabilities.
To further improve PBs, computer simulations provide insight into qualities that are difficult to measure directly. However, computer models are limited in their ability to fully replicate the complex dynamics involved.
“Experiments serve as a direct lens into nature’s behavior and thus will always give physical results, given they are performed correctly,” said author Mohamed A. Abdelbar. “Comparing the results of simulations and experimental data allows us to ensure that our models and theoretical framework are grounded in physical reality.”
Instead of maintaining all the atomic structure and chemical detail, simulations often use a coarse-graining method that maintains only essential information. Coarse graining represents chemical monomers as beads which interact to form the polymer chain. This enables longer and larger simulations, but the limited detail returns results that are difficult to compare to experimental values. The Kremer-Grest bead-spring model is a simple, yet effective, coarse-graining model that others have built upon.
Thermostats control the temperature of such models and implicitly incorporate forces. As thermostat techniques improve, the authors recommend only applying the thermostat to the model’s confining walls, so the solvent does not artificially maintain a non-physical, constant temperature.
Computational limitations require simplified models of smaller chains on shorter time scales. The scale of computational simulations is often at least an order of magnitude smaller than PB experiments. And scale is not the only challenge when comparing simulated and experimental results. Unlike in models, in the lab, controlling properties like PB length, density, and stiffness is difficult.
As computational capabilities improve, so do simulations’ ability to provide insight into PBs and expand the vast applications of PBs.
“Molecular simulations are a great way of supplementing our theoretical understanding of such systems and providing access to unmeasurable quantities,” Abdelbar said.
Abdelbar is hopeful for future applications of PBs.
"Polymer brushes are showing great promise in restoring lubrication to degraded human cartilage, which could be crucial in the fight against osteoarthritis.”
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Surface Science Spectra Special Topic Collection: Atomic Layer Deposition and Atomic Layer Etching
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Submission Deadline: November 1, 2023
Surface Science Spectra (SSS) welcomes data submissions related to Atomic Layer Deposition (ALD) and Atomic Layer Etching (ALE) for publication in a Special Topic Collection planned in collaboration with the annual 23rd International Conference on Atomic Layer Deposition (ALD 2023) and the 10th International Atomic Layer Etching Workshop, taking place July 23-26, 2023 in Bellevue, Washington. This collection will include data presented during the annual meeting and workshop as well as other ALD and ALE data that was not presented at the conference but is submitted to the collection.
This collection is open to all techniques published in SSS, so consider submitting your XPS, AES, ToF-SIMS, SE, UV-vis, or LEIS data to the Special Topic Collection on ALD and ALE.
Upon acceptance in SSS, your data will be stored and available as a reference to researchers worldwide.
Submission requirements and templates can be found here.
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Quantum Frequency Interferometry: With Applications Ranging from Gravitational Wave Detection to Dark Matter
Authors: R. Howl and I. Fuentes
Publication: AVS Quantum Sci. 5, 014402 (2023)
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AVS Journals Announcements and Open Topics - Calls for Papers
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AVS Quantum Science (AQS):
JVST A:
JVST B:
Biointerphases:
Surface Science Spectra (SSS):
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AVS e-Talk: Surface Microscopy and Microanalysis in an Industrial Research Laboratory (FREE!)
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April 19, 2023
Virtual
Vincent S. Smentkowski, Senior Scientist, GE Vernova Advanced Research Center, will present a FREE AVS e-Talk on April 19, 2023 ( 1:00 p.m.-2:00 p.m. ET) on Surface Microscopy and Microanalysis in an Industrial Research Laboratory. Register for FREE by April 17, 2023
Overview
The top few nanometers of a sample is defined as the surface. The surface is where most chemical reactions take place. There are many instances where the surface of materials is designed/functionalized in order to optimize properties and improve device performance; there are other instances where the surface becomes compromised and the material/device performance degrades. Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) are the three most common, and commercially available, surface analysis techniques. These techniques provide complimentary information regarding the composition/microstructure of the surface and sub-surface region of a sample. In this presentation, I will introduce AES, XPS, and ToF-SIMS, show typical data, and discuss how the data helped understand mechanisms and/or resolve material problems. I will also introduce techniques which we do not have in-house,but have access to via external collaborations.
Who Should Attend
e-Talks are an online forum to learn about the latest trends in the core technical areas of the AVS. All AVS e-Talks are geared toward a general technical audience, including academic and industrial researchers, technologists, policy-makers, and the public.
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49th International Conference on Metallurgical Coatings & Thin Films (ICMCTF 2023)
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May 21-26, 2023
Town and Country Resort and Conference Center
San Diego, California
The 49th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2023) is the premier international conference in the field of thin film deposition, characterization, and advanced surface engineering promoting global exchange of ideas and information among scientists, technologists, and manufacturers. Attendees from all over the world come to present their findings, exchange ideas, share insights, make new friends, and renew old acquaintances.
ICMCTF 2023 will include more than 90 high-profile invited speakers, in over 50 sessions, across fourteen technical and topical symposia. There will be several special interest talks and featured lectures, as well as focused topic sessions, short courses, an equipment exhibition, an awards program, and daily social networking events.
Short Courses:
Eight half-day short courses covering topics related to thin film deposition, characterization, and advanced surface engineering will be held during ICMCTF 2023 from Sunday-Thursday, May 21-25, 2023. All short courses will include detailed course notes and will run from 8:30 a.m.-12:30 p.m. or 1:30-5:30 p.m. Cost: $250 Regular and Student Attendees.
Sunday, May 21, 2023
Monday, May 22, 2023
Tuesday, May 23, 2023
Wednesday, May 24, 2023
Thursday, May 25, 2023
The equipment exhibition is a great place to network and learn about new products, services, and application techniques that will help improve all facets of R&D, Engineering, Manufacturing, Quality Control, and general laboratory operations. Visit the exhibit hall for FREE (by registering as Exhibits Only) on Tuesday, May 23, from 12:00-7:00 p.m. and Wednesday, May 24, from 10:00 a.m.- 2:00 p.m. There are also discounted conference registration rates for those in the San Diego area.
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July 23-26, 2023
Bellevue, Washington
Call for Abstracts Reopens April 4
The conference will take place Sunday, July 23-Wednesday, July 26, 2023, at the Hyatt Regency Bellevue in Bellevue, Washington (East Seattle). As in past conferences, the meeting will be preceded (Sunday, July 23) by one day of tutorials and a welcome reception. Sessions will take place (Monday-Wednesday, July 24-26) along with an industry tradeshow.
All presentations will be audio-recorded and provided to attendees following the conference (posters will be included as PDFs). Anticipated attendance is 800+.
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16th International Conference on Mid-Infrared Optoelectronics: Materials and Devices (MIOMD 2023)
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August 6-10, 2023
Norman, Oklahoma
- Materials Development, Growth, and Characterization for Infrared Optoelectronics
- Interband and Intersubband Infrared Materials and Devices including Quantum and Interband Cascade Lasers
- Infrared Emitters and Detectors
- Novel Architectures Based on New Materials and Low-Dimensional Structures
- Non-Linear Mid-Infrared Technologies
- Materials and Devices for THz Technologies
- Mid-Infrared Photonic Integrated Circuits
- Plasmonics and Other Mid-Infrared Metamaterials
- Topological Insulators with Mid-Infrared Functionality
- Mid-Infrared Quantum Optics and IR Frequency Combs
- Applications of Mid-Infrared Optoelectronic Devices: Chemical Sensing, Thermal Imaging, and Other Applications of Mid-Infrared Optoelectronic Devices
- Mid-IR Optical Fibers
- Mid-IR Optoelectronics: Materials and Devices Poster Session
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6th U.S. Workshop on Gallium Oxide (GOX 2023)
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August 13-16, 2023
Buffalo, New York
Call for Abstracts Deadline: April 5, 2023
Ultra-wide bandgap materials have emerged as a potential route towards next generation power and RF devices with superior performance compared to conventional semiconductors such as Si, GaAs, SiC or GaN. Many of the figure-of-merits for predictive device performance scale non-linearly with increasing critical electric field which is directly related to increasing bandgap and show great promise for these materials. Gallium oxide (Ga2O3) is an UWBG material of particular interest due to the availability of high-quality, relatively inexpensive, large-area native substrates with a wide range of doping required for various applications. Despite tremendous advances in materials, device, and thermal management, there are many outstanding technical challenges that must be addressed in order to realize the full potential of Ga2O3. These include but are not limited to: epitaxial material quality and reductions of native defects; bulk substrate growth; advanced device scaling and fabrication processes; heterojunctions; thermal management; electrical and thermal co-design; and benchmarking circuit performance.
After a highly successful and widely attended in-person conference in Washington DC in August 2022, the 6th U.S. Workshop on Gallium Oxide (GOX 2023) will be held in the University at Buffalo Campus, Buffalo, New York on August 13-16, 2023. In this rapidly advancing field, this workshop provides a premier platform for reporting recent advances in materials, device, and circuit development and identify major scientific gaps. The intent is to create actionable coordination across government, industry, and academia to enable rapid transitional technologies in this field. There will be no written proceedings to facilitate a friendly and stimulating environment for scientific discussions among participants from domestic and international Ga2O3 research groups. Attendees can expect topics including, but not limited to: bulk and epitaxial growth, theory/modeling/simulations, device and circuit advancements, materials characterization and novel properties, thermal management, electro-thermal co-design and heterostructures.
GOX 2023 will consist of two and a half days of presentations by invited and contributed speakers, as well as two evening poster sessions where the latest Ga2O3 results can be discussed. The workshop will be preceded by a welcome reception beneficial for networking with others in the field and establishing new collaborations.
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September 17-20, 2023 (Plus a Workshop September 16-17, 2023)
Madison, Wisconsin
Call for Abstracts Deadline: April 19, 2023
The 37th North American Conference on Molecular Beam Epitaxy (NAMBE 2023) is a prominent international forum for reporting scientific and technological developments in Molecular Beam Epitaxy research. The conference showcases important results from fundamental materials and device research, through technological applications, and into high-volume and low-cost production. NAMBE features the presentations of the MBE Innovator Award, the NAMBE Young Investigator Award, and the Best Student Paper awards.
In addition to a diverse technical program, vendors will exhibit the latest equipment available for material growth and characterization. The exhibit will surround the coffee breaks and poster presentations, providing many opportunities for discussions between attendees and vendors. There will also be a job board.
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AVS 69th International Symposium & Exhibition
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November 5-10, 2023
Portland, Oregon
“Two is Better than One: Breaking Barriers with Coupled Phenomena” - Featuring Presentations on Emerging Topics Related to Materials, Processing & Interfaces
The AVS International Symposium and Exhibition addresses cutting edge issues associated with materials, processing and interfaces in both the research and manufacturing communities.
The weeklong Symposium fosters a multidisciplinary environment that cuts across traditional boundaries between disciplines, featuring papers from AVS Technical Division, Groups, Focus Topics on emerging technologies and more.
An extensive Exhibition of related equipment, tools, materials, supplies, chemicals, services, consulting, technical literature, and new technologies are showcased during the week.
Call for Abstracts Deadline: May 10, 2023
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Upcoming AVS Sponsored Events
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August 6-10, 2023
Norman, Oklahoma
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August 13-16, 2023
Buffalo, New York
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September 17-20, 2023
Madison, Wisconsin
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