Introducing the NEW
Epsilometer for Dielectric Material Measurement
This solution uses a new methodology,
according to Dr. John Schultz of Compass Technology,

 “Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss.
This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.”
Clarke & Severn Electronics | Phone: +612 9482 1944 | Email:
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