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Got Questions? We've Got Answers

Hi Gregg,

At Chroma, we understand that selecting and using optical filters can raise many questions. To help you find the answers you need, we’ve compiled a comprehensive FAQ page covering the most common questions we receive.


Examples of Frequently Asked Questions:

Can I use a longpass emission filter as a dichroic?

No. All of our filter and dichroic designs are very angle-sensitive. Our emission filters are designed for a zero-degree angle of incidence (AOI), while dichroics are designed for a 45-degree AOI (unless otherwise specified). Changing this angle will drastically shift the spectral performance of the part.


Do I need an excitation filter with my single color LED?

Yes, an excitation filter is required. The output of LED light sources is not monochromatic and instead has a Gaussian-shaped spectral emission profile. The “tails” of this LED emission often extend >40nm from the peak wavelength and must be excluded from the passband of the emission filter. An excitation filter will block these unwanted wavelengths and transmit only the desired wavelengths to your sample.


These are just a couple examples. For more detailed information and to explore additional questions, visit our FAQ page to get the most complete answers to your questions.

Visit FAQ Page
 

🗓️ Upcoming Photonics Trade Shows

SPIE Optics + Photonics

August 18th - August 22nd, 2024

San Diego, California, USA


This event is a unique opportunity to explore and discover the latest developments in optical engineering and applications.


Be sure to stop by booth #430 to learn about the role Chroma's filters play in a wide range of photonics applications.

Society for Neuroscience

October 5th - October 9th, 2024

Chicago, Illinois, USA


Come say 👋 in booth #317 at SNF 2024, a global gathering of neuroscientists. We'll be there ready to discuss how we can help you further your research with catalog and/or custom designed optical filters.

SCIX 2024

October 20th - October 25th, 2024

Raleigh, NC, USA


Explore the latest in analytical chemistry and spectroscopy at SCIX 2024 and learn how Chroma's filters can enhance your application in booth #216c.

 

Featured Image: Detection of halo around Abell 15

We are delighted to feature an incredible image of the planetary nebula Abell 15, captured using Chroma filters.


Located in Canis Major, Abell 15's core is a mere 36.6 arcseconds in diameter. However, the New Horizon Team (NHZ), led by Tim Schaeffer, unveiled a stunning halo around it during an H-alpha survey.

Image credit: New Horizon Team (NHZ)

What makes this discovery particularly fascinating is the collaborative journey behind it. This particular halo has been independently detected multiple times over the years by passionate astrophotographers Chester Hall-Fernandez, Marcel Drechsler, and Sakib Rasool, showcasing what is possible with astrophotography.


The NHZ Team worked together to gather over 70 hours of data to create the image of the region. Their final result is a testament to the possibilities of collaboration and amateur astrophotography.


We hope you enjoy this breathtaking image and its interesting story of discovery as much as we do.

Learn More About the Discovery
 

Optical Filters for Semiconductor Inspection and Metrology Applications

Enhance your semiconductor manufacturing processes with Chroma Technology's precision-engineered optical filters. Our filters are designed to meet the rigorous demands of semiconductor inspection and metrology applications, ensuring superior performance and reliability.

Applications for Chroma Filters in Semiconductor Inspection:

Defect Detection: Ensure high-precision detection and minimal defects in your semiconductor products.

Laser-Based Inspection: Achieve precise and reliable measurements with high-quality filters for laser-based techniques.

 

Material Characterization: Gain valuable insights into material quality and performance through detailed characterization.

Overlay Accuracy Inspection: Detect and correct overlay deviations with superior accuracy.

Particle Detection: Enhance the sensitivity and accuracy of your particle detection systems to avoid contamination.

Sub-Surface Inspection: Utilize short-wave infrared (SWIR) filters to uncover hidden defects beneath the surface layers.

Benefits of Using Chroma Filters:


🔹 Precise Wavelength Selection: Isolate and analyze specific wavelengths for detecting the finest details and subtlest defects.


🔹 Superior Optical Performance: Enjoy excellent image quality, low phase retardance, and high durability backed by Chroma's industry-leading warranty.


🔹Compatibility: Filters designed specifically for light sources used in semiconductor inspection applications.


🔹 Customizable Solutions: Our filters can be tailored to meet specific wavelength requirements, ensuring optimal performance for your unique application​​.

Explore our catalog of optical filters and unlock the full potential of your semiconductor inspection systems or Contact Us today to learn how Chroma's expertise can enhance your semiconductor inspection and metrology applications.

Explore Chroma Filters for Semiconductor Applications
 
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Chroma Newsletter - August 2024

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