GaN-on-SiC Transistor Evaluation Kits
Help Verify Performance in RF Systems
Integra are offering Gallium Nitride on Silicon Carbide (GaN-on-SiC) HEMT transistor evaluation kits to designers evaluating this technology for their high power amplifier designs.

Each kit is customised to include a designer’s transistor model of choice (partially or fully-matched options are available) and includes a test fixture with one transistor fully mounted and tested, and a second spare device.

Full RF test results, as tested under key conditions by the Integra technical support team, are also provided as a reference guideline.

In this application note, Integra recommends comparing your measured data with their RF data for the serial number installed in the test fixture and to reconcile any discrepancies before removing or changing the transistor.

Contact us to order your evaluation kit today. These kits can be borrowed free for 30 days and extended if needed or be purchased to own.
Learn more by downloading the Application Note “Handling and Adjustment of Integra Technologies GaN-on-SiC HEMT Evaluation Kits”.

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