Selected Articles from the JVST B Special Issue on Secondary Ion Mass Spectrometry

Stefania Vitale, Gabriella Zappalà, Nunzio Tuccitto, Alberto Torrisi, Enrico Napolitani and Antonino Licciardello

J. Vac. Sci. Technol. B 34, 03H110 (2016) |  Read More

 

Time-of-flight secondary ion mass spectrometry as a tool for evaluating the plasma-induced hydrogenation of graphene

Joshua S. Wallace, Austin Quinn, Joseph A. Gardella Jr., Jing Hu, Eric Siu-Wai Kong and Han-Ik Joh

J. Vac. Sci. Technol. B 34, 03H113 (2016) |  Read More

 

Characterization of nanometric inclusions via nanoprojectile impacts

Aaron B. Clubb, Michael J. Eller, Stanislav V. Verkhoturov, Emile A. Schweikert, Rachel M. Anderson and Richard M. Crooks

J. Vac. Sci. Technol. B 34, 03H104 (2016) |  Read More

 

XPS depth profiling of organic photodetectors with the gas cluster ion beam

Jakub Haberko, Mateusz M. Marzec, Andrzej Bernasik, Wojciech Łuzny, Pierre Lienhard, Alexandre Pereira, Jérôme Faure-Vincent, David Djurado and Amélie Revaux

J. Vac. Sci. Technol. B 34, 03H119 (2016) | Read More

 

Structural and compositional analyses of Cu(In,Ga)Se₂ thin film solar cells with different cell performances

Minjung Kim, Jihye Lee, Yeonhee Lee, Jeung-hyun Jeong and Kang-Bong Lee

J. Vac. Sci. Technol. B 34, 03H121 (2016) |  Read More

 

Parallel imaging MS/MS TOF-SIMS instrument

Gregory L. Fisher, John S. Hammond, Paul E. Larson, Scott R. Bryan and Ron M. A. Heeren

J. Vac. Sci. Technol. B 34, 03H126 (2016) |  Read More

 

Secondary ion and neutral mass spectrometry with swift heavy ions: Organic molecules

Lars Breuer, Florian Meinerzhagen, Matthias Herder, Markus Bender, Daniel Severin, Jordan O. Lerach and Andreas Wucher

J. Vac. Sci. Technol. B 34, 03H130 (2016) |  Read More

 

Time-of-flight secondary ion mass spectrometry as a screening method for the identification of degradation products in lithium-ion batteries-A multivariate data analysis approach

Danica Heller, Birgit Hagenhoff and Carsten Engelhard

J. Vac. Sci. Technol. B 34, 03H138 (2016); Read More

Focused ion beam time-of-flight secondary ion mass spectroscopy tomography of through-silicon vias for 3D integration

Jean-Paul Barnes, Larissa Djomeni, Stéphane Minoret, Thierry Mourier, Jean-Marc Fabbri, Guillaume Audoit and Sabrina Fadloun

J. Vac. Sci. Technol. B 34, 03H137 (2016) |  Read More

 

Quantification of matrix and impurity elements in Al _xGa _1−xN compounds by secondary ion mass spectrometry