See our past e-mails.

Join Us For An Online Technical Meeting

Opportunities for AI in EMC and SIPI


Monday, October 23, 2023 • 11:00 AM EDT

There are a lot of questions about what role machine learning, artificial intelligence and deep learning has in EMC, Signal Integrity and Power Integrity. Can it provide a useful tool for us or is it merely an interesting topic for discussion? The increasing number of papers suggests that there is a role and we are in the ‘pioneer’ phase of exploring this and creating the tools that will allow us to achieve more than we have so far.


Many of us have ideas about where we might be able to exploit this technology but need more background before giving them serious consideration. Others are sceptical about AI in EMC and SIPI but would welcome a discussion. Some already have significant expertise. To promote exchanges within (and beyond) our broad community, the EMC Society has created a new Special Committee (SC3) on Machine Learning and AI in EMC and SIPI. This online event is the first in what we anticipate being a number of meetings to explore the synergies between techniques and applications (and define where we need further research).

 

Please join us for this online Technical Meeting. Moderated by Alistair Duffy (immediate past president of the EMC Society, a Director of the IEEE and inaugural chair of SC3) this meeting will consist of three talks, with plenty of time for questions and comments.

 
 

 PRESENTATIONS - SPEAKERS:

“Machine Learning for SI & PI Engineering – Why Now? ”

Professor Christian Schuster

Institut für Theoretische Elektrotechnik , Hamburg University of Technology (TUHH)

“Machine Learning Applications of Signal Integrity and Power Integrity”

Dr. Zhiping Yang

CEO of JAY Plus Inc and Adjunct professor at MST EMC lab with power integrity expertise honed at Google and Waymo.

“AI/ML Revolution in EMC-SIPI: EDA Transformation”

Dr. Majid Ahadi Dolatsara

Keysight Technologies, winner of the 2021 Richard B. Schulz Best Transactions Paper Award of IEEE Transactions on Electromagnetic Compatibility for their paper Worst-Case Eye Analysis of High-Speed Channels Based on Bayesian Optimization.

REGISTER TODAY!
 

We welcome questions and topics of interest ahead of the meeting so our speakers can cover the issues that matter to you.

SUBMIT YOUR QUESTIONS HERE
 
Sponsored by the IEEE EMC Society
Please keep in touch and learn what’s new
via our social media channels and podcasts.
Facebook      Instagram      Linkedin      Youtube      X
#IEEE_ESP24