Polarization-separated, Phase-shifted Interferometer
A polarization-separated, phase-shifted interferometer generates interferograms without moving parts by using an electro-optic phase modulator to adjust the phase between sample and reference beams. These beams, in orthogonal polarization states, are routed through a polarizing beam splitter and quarter-wave plates, then projected onto a detector via a 45° linear polarizer, where they interfere to produce an output used for mapping surface topography.
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