Submit Your Spectroscopic Ellipsometry Data to Surface Science Spectra
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We invite you to consider submitting your optical property spectra to the journal Surface Science Spectra (SSS). SSS is devoted to archiving spectra from various surface analysis techniques including x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), low energy ion scattering (LEIS) spectroscopy, and optical measurements including spectroscopic ellipsometry (SE) and ultraviolet-visible spectroscopy (UV-vis). If spectra have been previously published in another form, permission from the respective publisher may be needed. Upon acceptance, your high-quality spectroscopic optical property data would be stored and available as a reference to researchers worldwide, and you would have the accomplishment of another peer-reviewed publication.
For submission we will need a completed template and your spectral data. At revision you will also need to include your individual optical property spectra files. There are Word templates available for XPS/AES, SIMS, LEIS, and Optical Property Measurements (SE, UV-vis, etc.) submissions at https://avs.scitation.org/sss/authors/manuscript.
The journal publishes three types of spectra articles: Reference, Comparison, and Technical. The associated data is searchable and downloadable directly from the online article. For the scope of the journal and more information, please visit: http://avs.scitation.org/journal/sss. Below, you can view a sampling of some of the SE submissions published in SSS in recent years. You can access them FREE for a limited time.
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Richard T. Haasch
Editor-in-Chief
Surface Science Spectra
Senior Research Scientist
Materials Research Laboratory
University of Illinois at Urbana-Champaign
Urbana, IL 61801-2985
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Nikolas J. Podraza
Associate Editor
Surface Science Spectra
Professor
Department of Physics & Astronomy
Toledo, OH 43606-3390
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Diphenylsiloxane–dimethylsiloxane copolymer: Optical functions from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry
Dhananjay I. Patel, Dhruv Shah, Tuhin Roychowdhury, Joshua I. Wheeler, Daniel H. Ess, James N. Hilfiker and Matthew R. Linford
Surface Science Spectra 27, 026001 (2020) READ MORE
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Polyethylene glycol: Optical constants from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry
Dhruv Shah, Tuhin Roychowdhury, James N. Hilfiker and Matthew R. Linford
Surface Science Spectra 27, 016001 (2020) READ MORE
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Polymethyl methacrylate: Optical properties from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry
Tuhin Roychowdhury, Dhruv Shah, James N. Hilfiker and Matthew R. Linford
Surface Science Spectra 27, 016002 (2020) | READ MORE
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Optical function of atomic layer deposited alumina (0.5–41.0 nm) from 191 to 1688 nm by spectroscopic ellipsometry with brief literature review
Dhruv Shah, Dhananjay I. Patel, Tuhin Roychowdhury, Dylan Jacobsen, Jacob Erickson and Matthew R. Linford
Surface Science Spectra 26, 026001 (2019) READ MORE
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Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry
Tuhin Roychowdhury, Cody V. Cushman, R. A. Synowicki and Matthew R. Linford
Surface Science Spectra 25, 026001 (2018) READ MORE
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Optical properties of soda lime float glass from 3 mm to 148 nm (0.41 meV to 8.38 eV) by spectroscopic ellipsometry
Maxwell M. Junda and Nikolas J. Podraza
Surface Science Spectra 25, 016001 (2018) READ MORE
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