Join us for the IEEE EMC-S Young Professional Ambassador Fall 2025 Webinar Series

Thursday, October 23, 2025: 12:00 – 1:30 PM EDT

Karthik Vepuri
NCEE Labs, Lincoln, NE, USA

“Birth of EMC Standards: Know the Story Behind Standards in US and Europe”

Nika Amralah

Department of National Defence

Ottawa, ON, Canada

“Launching Your EMC Career: A Blueprint for Young Engineers”

Pavithrakrishnan Radhakrishnan

Oklahoma State University, Stillwater, OK, USA

“Shields are the Best Friends”

Bill Kim

Google, Sunnyvale, CA, USA

“Dk and Df Characterization of Low-loss Dielectric Liquid by Cylindrical Cavity Resonator”

Xinglong Wu

Politecnico di Milano, Milan, Italy

“EMC Analysis and Modeling of Multiconductor Transmission Lines”

Tom Hartman

University of Twente Enschede, The Netherlands

“From Susceptible Static Energy Meters to Electromagnetic Compatible Energy Measurements”

Wednesday, October 29, 2025: 10:00 – 11:00 PM EDT
(Morning of October 30^th Locally for Asia Audience)

Zhenyu Zhao

National University Singapore, Singapore

“Non-Contact Online Impedance Measurement Technology”

Hanzhi Ma

Zhejiang University, Zhejiang, China

“Signal Integrity Modeling and Optimization for Neuromorphic Chips”

MODERATED BY:

Mr. Patrick DeRoy

EMC Society, Young Professionals (YP) Representative

Call for IEEE EMC Society Young Professionals Ambassador Nominations 

Nominations Due: November 30, 2025

The objective of this program is to inspire and inform EMC-S Young Professionals on a variety of topics, both technical and non-technical, to enhance their interest and engagement in the field of Electromagnetic Compatibility, Signal Integrity and Power Integrity, by delivering talks at various chapters/sections “on-demand” virtually (or in-person at the Ambassador’s local Chapter if desired).

Eligibility:

• Be an IEEE EMC-S Member.
• Belong to IEEE YP Group as defined by IEEE (IEEE members and volunteers who received their first professional degree within the past 15 years – www.yp.ieee.org
• Five years or more experience reflecting professional maturity.

#IEEE_ESP26